Autronica AutroFlame X33AF Spécifications Page 8

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Description
Installation Handbook, AutroFlame X33AF PL Multispectrum IR Flame Detector, 116-P-X33AF/PL/DE, 2005-12-12,
Autronica Fire and Security AS
Page 6
2.2.2 Magnetic Oi
The detector also incorporates a magnetic oi feature that provides the
same calibrated test as the automatic oi, and in addition actuates an
alarm to verify output operation for preventive maintenance
requirements. This feature can be performed at any time and
eliminates the need for testing with an external test lamp.
CAUTION: These tests require disabling of all extinguishing devices
to avoid release resulting from a successful test.
Perform the magnetic oi test by placing a magnet by the marked
location (mag oi) on the outside of the detector. This test activates the
calibrated IR emitters. If the resulting signals meet the test criteria,
indicating that greater than half of the detection range remains, an
alarm message is sent to the panel and the indicating LED changes to
red. This condition remains until the magnet is removed.
If less than half of the detection range remains, no alarm is produced
and a fault is generated.
The AutroSafe IFG panel has to be reset after the test is completed.
2.3 Automatic Alarm Test
The X33AF PL performs an automatic alarm-path test every 24 hours.
This test includes the functionalities of the magnetic oi test, and is also
making sure that the alarm is transmitted to the panel. If this test is
successful, no indication will be given on the panel. However, if the
test fails, a fault message is generated on the AutroSafe IFG panel.
2.4 Communication
The X33AF PL has built-in PowerLoop technology which makes the
detector capable of being powered by and communicating with
AutroSafe Integrated Fire and Gas panels (IFG) on the same pair of
wire, saving cable cost and weight.
2.5 Data Logging
Data logging capability is also provided. Status conditions such as
normal, power down, general and oi faults, pre-alarm, fire alarm, time
and temperature are recorded. Each event is time and date stamped,
along with the temperature and input voltage. Event data is stored in
non-volatile memory when the event becomes active, and again when
the status changes. Data from the log can only be extracted at the
factory.
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